figure description and reference

contents/core/robust_ai/robust_ai.qmd

@@ -120,9 +120,9 @@ Transient faults in hardware can manifest in various forms, each with its own un
 
 Some of the common types of transient faults include Single Event Upsets (SEUs) caused by ionizing radiation, voltage fluctuations [@reddi2013resilient] due to power supply noise or electromagnetic interference, Electromagnetic Interference (EMI) induced by external electromagnetic fields, Electrostatic Discharge (ESD) resulting from sudden static electricity flow, crosstalk caused by unintended signal coupling, ground bounce triggered by simultaneous switching of multiple outputs, timing violations due to signal timing constraint breaches, and soft errors in combinational logic affecting the output of logic circuits [@mukherjee2005soft]. Understanding these different types of transient faults is crucial for designing robust and resilient hardware systems that can mitigate their impact and ensure reliable operation.
 
-All of these transient faults are characterized by their short duration and non-permanent nature. They do not persist or leave any lasting impact on the hardware. However, they can still lead to incorrect computations, data corruption, or system misbehavior if not properly handled.
+All of these transient faults are characterized by their short duration and non-permanent nature. They do not persist or leave any lasting impact on the hardware. However, they can still lead to incorrect computations, data corruption, or system misbehavior if not properly handled, as exemplified by bit-flip errors, where a single bit in memory unexpectedly changes state, potentially altering critical data or computations [@fig-bit-flip].
 
-![](./images/png/image22.png)
+![An illustration of a bit-flip error, where a single bit in memory changes state, leading to data corruption or computation errors.](./images/png/image22.png){#fig-bit-flip}
 
 #### Causes of Transient Faults