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The scanCONTROL 3060-25 returns incorrect measurement profiles when using the PartialProfile mode, as implemented in the driver. The benefit of using the PartialProfile mode is only the xz-data is transmitted, instead of unused data of reflections and moments (see SDK documentation).
I have contacted Micro-Epsilon on the abovementioned issue, as it is also present in the SDK examples.
A temporary workaround is to launch the driver with the following settings:
Furthermore, the branch workaround_corrupt_profile_30x0 can be used to fix the issue, as it uses the full profile mode instead of the partial profile mode. (Do note that the branch is a little behind the master).
The text was updated successfully, but these errors were encountered:
The scanCONTROL 3060-25 returns incorrect measurement profiles when using the PartialProfile mode, as implemented in the driver. The benefit of using the PartialProfile mode is only the xz-data is transmitted, instead of unused data of reflections and moments (see SDK documentation).
I have contacted Micro-Epsilon on the abovementioned issue, as it is also present in the SDK examples.
A temporary workaround is to launch the driver with the following settings:
Furthermore, the branch
workaround_corrupt_profile_30x0
can be used to fix the issue, as it uses the full profile mode instead of the partial profile mode. (Do note that the branch is a little behind the master).The text was updated successfully, but these errors were encountered: