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Incorrect profiles using the PartialProfile mode with the scanCONTROL 3060-25 #25

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dave992 opened this issue Sep 21, 2020 · 1 comment

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@dave992
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dave992 commented Sep 21, 2020

The scanCONTROL 3060-25 returns incorrect measurement profiles when using the PartialProfile mode, as implemented in the driver. The benefit of using the PartialProfile mode is only the xz-data is transmitted, instead of unused data of reflections and moments (see SDK documentation).

I have contacted Micro-Epsilon on the abovementioned issue, as it is also present in the SDK examples.

A temporary workaround is to launch the driver with the following settings:

<node name="scancontrol_driver" pkg="micro_epsilon_scancontrol_driver" type="driver_node" output="screen" required="true" >
    <param name="partial_profile_start_point_data" value="0" type="int"/>
    <param name="partial_profile_data_width" value="8" type="int"/>
</node>

Furthermore, the branch workaround_corrupt_profile_30x0 can be used to fix the issue, as it uses the full profile mode instead of the partial profile mode. (Do note that the branch is a little behind the master).

@dave992
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dave992 commented Sep 21, 2020

@rtonnaer I recommend using the partial_profile_* options in the launch file to fix the issue you had last Wednesday.

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