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Currently, sampling points can only be scoped by Element ID. that is not very use-full in the context of DPF because the critical element IDs are not easy accessible.
New scopes are
by location / coordinates
by max element of field.
...
💡 Steps for implementing the feature
No response
🔗 Useful links and references
No response
The text was updated successfully, but these errors were encountered:
📝 Description of the feature
Currently, sampling points can only be scoped by Element ID. that is not very use-full in the context of DPF because the critical element IDs are not easy accessible.
New scopes are
💡 Steps for implementing the feature
No response
🔗 Useful links and references
No response
The text was updated successfully, but these errors were encountered: